MIL-M-38510-175 Microcircuits, Digital, Cmos, Positive Logic, Flip-Flops And Monostable Multivibrator, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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TABLE III.  Group A inspection for device type 04 - Continued.

1/  Pins not designated may be "high" level logic, "low" level logic or open.  Exceptions are as follows:  VIC(pos) tests, the VSS terminals shall be open; VIC(neg)  tests, the VDD terminal shall be open, ISS tests, the output terminals shall be open.

2/  The ISS measurements shall be performed in sequence.

3/  The device manufacturer may, at his option, measure IIL  and IIH  at 25°C for each individual input or measure all inputs together.

4/  The truth table tests shall be performed in sequence.

5/  The truth table tests shall be performed at VDD  ≤ 5 V and ; 18 V.  See footnote 10/ which contains complete tabulation of input/output voltage levels.

6/  See 4.4.1c.

7/  For tests 28 through 31, terminals 2 and 14 are each connected through separate 22 kν ±10% resistors to VSS.

8/  Terminals 2 and 14 are each connected through separate 22 kν ±10% resistors to VSS.