MIL-M-38510-653 Microcircuits, Digital, High Speed, Cmos Flip-Flops, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, high speed CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part or identifying number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/6538

NOTES:

1. CLEAR and PRESET pulses are active low and dominate regardless of the state of the clock and

data inputs.

2. CLEAR or PRESET input pulse characteristics are as follows:

tr = tf ≤ 6 ns; tp (CLEAR) = tp (PRESET) ≤ 30 ns; tREM ≤ 38 ns.

3. CL = 50 pF ±10 % (including test jig and probe capacitance).

4. While testing the CLEAR input at a logic "0" level, PRESET will have a logic "1" level applied.

While testing the PRESET input at a logic level "0", CLEAR will have a logic "1" applied.

5. Voltage measurements are to be made with respect to the network ground terminal. The input signal(s) for

HCT device type 52 will be 0 V to 3 V; however, the 50 % measurements point is 1.3 V for inputs and outputs.

FIGURE 3. CLEAR switching test circuit and waveforms (device types 02 and 52) - Continued.