MIL-M-38510-653 Microcircuits, Digital, High Speed, Cmos Flip-Flops, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, high speed CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part or identifying number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/6538

NOTES:

1. Clock input pulse characteristics: tr = tf ; 6 ns; tp (clock) ; 30 ns.

2. Data input pulse characteristics: : tr = tf ; 6 ns; tp (data) ; 38 ns;

(for device type 52), tp (data) ; 33 ns; tsetup ; 30 ns; thold ; 8 ns.

(for device type 52), thold ; 3 ns; PRR � 1 MHz.

3. The clock input characteristics for fMAX are as follows: tr = tf ; 6 ns; tp (clock) ; 24 ns; PRR � 21 MHz.

4. CL = 50 pF ±10% (including test jig and probe capacitance).

5. Voltage measurements are to be made with respect to network ground terminal. The input signal(s) for

HCT device type 52 will be 0 V to 3 V; however, the 50 % VCC measuring point is 1.3 V for input and output.

6. tTLH = tTLH1 - tTLH2 ; tTHL = tTHL2 - tTHL1.

FIGURE 3. Synchronous switching test circuit and waveforms (device types 02 and 52) - Continued.