MIL-M-38510-653 Microcircuits, Digital, High Speed, Cmos Flip-Flops, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, high speed CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part or identifying number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/653B

1.4  Recommended operating conditions - Continued.

Device type 52:

Maximum input low voltage  (VIL)  ........................................................... 0.8 V at VCC  = 4.5 V to 5.5 V Minimum input high voltage  (VIH) ........................................................... 2.0 V at VCC  = 4.5 V to 5.5 V Supply voltage range (VCC)  .................................................................... 4.5 V dc to 5.5 V dc

Output voltage range (VOUT)  ................................................................... 0.0 V dc to VCC

Operating ambient temperature range  (TA)  ........................................... -55°C to +125°C

Width of clock pulse (tp  clock) ................................................................. 30 ns minimum

Width of clear pulse (tp  clear)  ................................................................. 30 ns minimum

Width of preset pulse (tp  preset) .............................................................. 30 ns minimum

Data setup time before clock (tsetup) ........................................................ 30 ns minimum

trem  setup time before clock (tsu  clear or tsu  preset)  ................................. 38 ns minimum

Hold time (thold) ........................................................................................ 3 ns minimum

Input rise and fall times (tr, tf):

VCC  = 4.5 V............................................................................................ 500 ns maximum

2.  APPLICABLE DOCUMENTS

2.1  General.  The documents listed in this section are specified in sections 3, 4, or 5 of this specification.  This section does not include documents cited in other sections of this specification or recommended for additional information or as examples.  While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed.

2.2  Government documents.

2.2.1  Specifications and Standards.  The following specifications and standards form a part of this specification to the extent specified herein.  Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATION

MIL-PRF-38535   -        Integrated Circuits (Microcircuits) Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-883       -        Test Method Standard Microcircuits.

MIL-STD-1835     -        Interface Standard Electronic Component Case Outlines.

(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch or https://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.3  Order of precedence.  In the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence.  Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.

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