MIL-M-38510/206D
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-
38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM
plan shall not effect the form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to qualification and quality conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-
883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535, appendix B.
d. Freeze-out test: This test shall be conducted as a 100 percent screen on all class S devices having nichrome as the fusing link. Within no more that 24 hours after completion of burn-in and prior to final electrical test, all devices containing nichrome resistors (see 3.8.1 and 3.8.2) shall be subjected to a freeze-out test. If more than 24 hours have elapsed subsequent to the +125°C burn-in exposure, devices shall be conditioned with at least +125°C for a minimum of 5 hours immediately prior to the freeze-out test. When the freeze-out test is peformed the +25°C final electrical test parameters shall be completed 96 hours after the freeze-out test. The freeze-out test shall be conducted as follows:
(1) Connect devices in the electrical configuration of figures 7 or in the burn-in configuration with the bias cycled, 3 minutes on and 3 minutes off, throughout the duration of test.
(2) Reduce device temperature to TC = -10° ±2°C with bias cycled and maintain at that temperature for a minimum of 5 hours duration.
(3) With the cycled bias maintained, allow TC to go to room temperature (by removal from cold chamber or termination of forced cooling but with no forced heating (and retain for a minimum of
19 hours subsequent to the completion of the 5-hour cold soak. TC shall not exceed = +35°C
during this period.
(4) Remove bias and subject all devices to subgroup 1 final electrical test to establish continuity of the nichrome resistors and remove all failed devices from the lot. Count them as screening rejects subject to PDA requirements.
e. Class B devices processed to an altered item drawing may be programmed either before or after burn-in at the manufacturer's discretion. The required electrical testing shall include, as a minimum, the final electrical tests for programmed devices as specified in table II herein. Class S
devices processed by the manufacturer to an altered item drawing shall be programmed prior to burn- in.
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.3.1 Qualification extension. When authorized by the qualifying activity, for qualification inspection, if a manufacturer qualifies one device type which is manufactured identically to other device types on this specification, then the other device types may be qualified by conducting only group A electrical tests and submitting data in accordance with MIL-PRF-38535 (i.e.,groups B, C, and D tests are not required).
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