MIL-M-38510-206 Microcircuit, Digital, 4096 Bit Schottky, Bipolar, Programmable Read-Only Memory PromThis specification covers the detail requirements for monolithic silicon, programmable read-only memory PROM microcircuits which employ thin film nichrome NiCr resistors, tungsten W or titanium tungsten TiW as the fusible link or programming element. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. A special test requirement is included in this specification to screen against devices which may contain excess moisture in the package materials or internal atmosphere see freeze-out test of 4.2d. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510/206D

TABLE II. Electrical test requirements.

MIL-PRF-38535 test requirements	Subgroups (see table III) 1/, 2/, 3/
MIL-PRF-38535 test requirements	Class S devices	Class B devices
Interim electrical parameters	1	1
Final electrical test parameters for unprogrammed devices	1, 2, 3, 7, 8	1, 2, 3, 7, 8
Final electrical test parameters for programmed devices	1, 2, 3, 7 8, 9, 10, 11	1, 2, 3, 7, 8, 9,
Group A test requirements	1, 2, 3, 7, 8, 9, 10, 11	1, 2, 3, 7, 8 9, 10, 11
Group B end-point electrical parameters subgroup 5	1, 2, 3, 7, 8, 9, 10, 11	N/A
Group C end-point electrical parameters	1, 2, 3, 7, 8, 9, 10, 11	1, 2, 3, 7, 8
Group D test requirements	1, 2, 3, 7, 8	1, 2, 3, 7, 8

1/ * indicates PDA applies to subgroups 1 and 7 (see 4.2c).

2/ Any or all subgroups may be combined when using high-speed testers.

3/ Subgroups 7 and 8 shall consist of verifying the pattern specified.

3.8 Processing options. Since the PROM is an unprogrammed memory capable of being programmed by either the manufacturer or the user to result in a wide variety of PROM configurations, two processing options are provided for selection in the contract, using an altered item drawing.

3.8.1 Unprogrammed PROM delivered to the user. All testing shall be verified through group A testing as defined in 3.3.2.1, table II, and table III. It is recommended that users perform subgroups 7 and 9 after programming to verify the specific program configuration.

3.8.2 Maunufacture-programmed PROM delivered to the user. All testing requirements and quality assureance provisions herein, including the requirements of the altered item drawing, shall be satisfied by the manufacturer prior to delivery.

3.9 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 14 (see Appendix A MIL-PRF-38535.)