MIL-M-38510-2 Microcircuits, Digital, Ttl, Flip-Flops, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, TTL, bistable logic microcircuits. Three product assurance classes and a choice of case outlines/lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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TABLE III.  Group A inspection for device type 02. 1/ - Continued.

NOTES:

A = Normal clock pulse.

B = Momentary GND, then 4.5 V. C = This note has been deleted.

D = Momentary 4.5 V, then GND.

E = Momentary ground, then 2.4 V. F = Momentary ground, then 5.5 V. J = This note has been deleted.

* After clock pulse apply -12 mA to clock pin to insure  Q   is still in the low state (see figure 15).

** Test time limit  ≤ 100 ms.

1/ Terminal conditions (pins not designated may be H � 2.0 V, or L ≤ 0.8 V, or open.)

2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum.

3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b) H � 1.5 V and L < 1.5 V when using a high speed checker single comparator.

4/ Tests shall be performed in sequence.

5/ Input shall be one normal clock pulse,  then 4.5 V

6/  FMAX, minimum limit specified is the frequency of the input pulse.  The output frequency shall ge one-half of the input frequency.

7/ For CKT A, IIH3  limits are 0 to 120 µA.