MIL-M-38510-117 Microcircuits, Linear, Adjustable, Positive, Voltage Regulators, Monolithic SiliconThis specification covers the detail requirements for three and four terminal monolithic silicon, adjustable, positive, voltage regulators. Two product assurance classes and a choice of case outlines and lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510/117C

NOTES:

1. Heavy current paths (I � 0.1 A) are indicated by bold lines.

2. Kelvin connections must be used for all output current and voltage measurements.

For device types 05 and 06, output voltage measurements shall be made at the case.

3. The output offset voltage shall be adjusted to zero with the device under test (DUT) removed.

The operational amplifier stabilization networks may vary with test adapter construction. Alternate drive circuits for the 2N6282 may be used to develop the proper load current and input

voltage pulses. These circuits shall require the approval of the qualifying activity.

4. Relay switch positions are defined in table III.

5. Load currents of 5 mA may be established via the 249 n load resistor. All other load currents shall be established via the pulse load circuit.

6. The pulse generator for the pulse load circuit shall have the following characteristics:

a. Pulse amplitude = - ( [IL[ - .005) volts. (referenced to -7 volts)

b. Pulse width = 1.0 ms (unless otherwise stated).

c. Duty cycle = 2% (maximum). d. Rise time = 30 µs (minimum).

7. Load currents shall be determined by the voltage measured across the 0.25 n resistor.

Measurements shall be made 0.5 ms after the start of the pulse.

8. VIN (LOW) and VIN (HIGH) per table III herein.

9. VRLINE = VB - VA.

10. The output voltage is sampled at specified intervals. Strobe pulse width is 100 µs maximum.

11. [IL[ (minimum) and [IL[ (maximum) per table III herein.

12. VRLOAD = VD - VC.

13. VRTH = VD - VE.

14. IOS = (IL) amps.

15. Output short circuit current measurements at t = 0.1, t = 0.5, and t = 5.0, are to be made on device

type 06 only.

FIGURE 10. Test circuit for static tests for device types 05 and 06 - Continued.