MIL-M-38510-117 Microcircuits, Linear, Adjustable, Positive, Voltage Regulators, Monolithic SiliconThis specification covers the detail requirements for three and four terminal monolithic silicon, adjustable, positive, voltage regulators. Two product assurance classes and a choice of case outlines and lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510/11?C

4. VERIFICATION.

4.1 Sampling and inspection. Sampling and inspection procedures should be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or function as described herein.

4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and quality conformance inspection. The following additional criteria shall apply:

a. For class S and B devices, an additional burn-in screen shall be performed to test the operation of the thermal shutdown circuit. This screen shall be performed after serialization (3.1.8 of method 5004 of MIL-STD-883) and before interim electrical parameters (pre burn-in, 3.1.9 of method 5004 of MIL-STD-883). The requirements of

3.2.3 of method 1015 of MIL-STD-883 shall apply to this screen except the devices need not be tested in an oven.

b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is optional at the discretion of the manufacturer.

c. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883.

d. Reverse bias burn-in shall not be performed.

e. Additional screening for space level product shall be as specified in MIL-PRF-38535.

f. Constant acceleration (method 2001 of MIL-STD-883); test condition B shall be used for case Y.

4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.

4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL- PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).

4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:

a. Tests shall be as specified in table II herein.

b. Subgroups 5, 6, 8, 9, 10, and 11 shall be omitted.

4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535 and as follows:

a. When using the method 5005 option, end point electrical parameters shall be as specified in table II herein. b. When using the method 5005 option, constant acceleration for class S (method 2001 of MIL-STD-883);

test condition B shall be used for case Y.