MIL-M-38510/1158
Device types |
01 |
02 |
03 |
04 |
05 |
06 |
07 |
08 |
RL |
1 kν |
2.4 kν |
3 kν |
4.8 k ν |
1 kν |
2.4 kν |
3 kν |
4.8 kν |
NOTES:
1. Output terminal must utilize a Kelvin connection.
2. S1: Position 2 for IOS test. Position 1 for all other tests.
3. Load currents of 5 mA shall be established via the load resistor RL. All other load currents shall be established via the pulse load circuit. The pulse generator has the following characteristics:
a. Pulse amplitude = 10 IL V. b. Pulse width = 1.0 ms
c. Duty cycle = 2% (maximum).
Load current is determined by the voltage across the 1 ν resistor. Measurements shall be made 0.5 ms after the start of the pulse.
4. An alternate drive circuit for 2N6296 transistor may be used to develop the proper load current
through the 1 ν resistor.
5. Use position 2 of S2 for ISCD, ISCD tests only.
6. VIN(LOW) and VIN(HIGH) per table III.
7. VRLINE = V8 - VA.
8. The output voltage is sampled at the specified intervals. Strobe pulse with is 100 μs maximum.
9. IL minimum and IL maximum per table III.
10. VRLOAD = VD - VC; VRTH = VE - VD.
11. Alternate point for applying load circuit directly with automatic test equipment (place S3 in position 2).
FIGURE 5. Test circuit for static tests.
24
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business