MIL-M-38510-757 Microcircuits, Digital, Advanced Cmos, Buffer Gates, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/757C

NOTES:

1. Preferred methods:

When measuring tPHZ or tPZH: VTEST = GND. When measuring tPLZ or tPZL: VTEST = 2(VCC).

2. Alternate method:

When measuring tPHZ or tPZH: VTEST = OPEN. When measuring tPLZ or tPZL: VTEST = 2(VCC).

3. CL = 50pF or equivalent (includes test jig and probe capacitance).

4. RL = 500ν or equivalent.

5. RT = 50ν or equivalent.

6. VIN = 0 V to VCC.

FIGURE 4. Switching waveforms and test circuit - Continued.