MIL-M-38510-757 Microcircuits, Digital, Advanced Cmos, Buffer Gates, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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Test and

MIL-STD-883 test method

Symbol

Test Conditions  1/

-55°C = TC  = +125°C

+3.0 V = VCC  = +5.5 V

unless otherwise specified

Device type  2/

VCC

Group

A subgrou ps

Limits  1/

Unit

Min

Max

Truth table test output voltage

3014

4/ 5/

14/

VIL  = 0.45 V, VIH  = 2.50 V Verify output VOUT

M

01-05, 11

3.0 V

7

L

H

D

L

H

P, L, R

L

H

F

01, 02, 03,

05

L

H

VIL  = 0.60 V, VIH = 3.70 V Verify output VOUT

All

4.5 V

7, 8

L

H

Propagation delay time, data to output

3003

tPHL, tPLH

4/  5/

15/ 16/

CL  = 50 pF minimum, RL  = 500ν

see figure 4

01, 03

3.0 V

9, 11

1.0

8.0

ns

10

1.0

11.0

02

9, 11

1.0

13.5

10

1.0

16.0

04, 05

9, 11

1.0

9.0

10

1.0

12.0

10, 11

9, 11

1.0

7.5

10

1.0

9.0

M

01, 03

9

1.0

8.0

02

1.0

13.5

04, 05

1.0

9.0

11

1.0

7.5

D

01, 03

9

1.0

8.0

02

1.0

13.5

04, 05

1.0

9.0

11

1.0

7.5

P, L, R

01, 03

9

1.0

8.0

02

1.0

13.5

04, 05

1.0

9.0

11

1.0

7.5

F

01

1.0

8.0

02

1.0

14.0

03

1.0

9.5

05

1.0

13.5