MIL-M-38510-757 Microcircuits, Digital, Advanced Cmos, Buffer Gates, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/757C

TABLE I. Electrical performance characteristics - Continued.

Test and MIL-STD-883 test method	Symbol	Test Conditions 1/ -55°C = TC = +125°C +3.0 V = VCC = +5.5 V unless otherwise specified		Device type 2/	VCC	Group A subgroups	Limits 1/		Unit
							Min	Max
Propagation delay time, output disable 3003	tPLZ, tPHZ 4/ 5/ 15/ 16/	CL = 50 pF minimum, RL = 500ν see figure 4		03-05 10, 11	3.0 V	9, 11	1.0	11.5	ns
						10	1.0	13.0
			M	03-05, 11		9	1.0	11.5
			D				1.0	11.5
			P, L, R				1.0	11.5
			F	05			1.0	13.5
				03			1.0	11.5
		CL = 50 pF minimum, RL = 500ν see figure 4		03-05 10, 11	4.5 V	9, 11	1.0	9.0	ns
						10	1.0	10.5
			M	03-05, 11		9	1.0	9.0
			D				1.0	9.0
			P, L, R				1.0	9.0
			F	03, 05			1.0	9.0

1/ Each input/output, as applicable shall be tested at the specified temperature for the specified limits. Output terminals not designated shall be high level logic, low level logic, or open, except as follows:

a. VIC (pos) tests, the GND terminal can be open. TC = +25°C. b. VIC (neg) tests, the VCC terminal shall be open. TC = +25°C.

c. All ICC tests, the output terminal shall be open. When performing these tests, the current meter shall be placed in the circuit such that all current flows through the meter.

For negative and positive voltage and current values, the sign designates the potential difference in reference to GND and

the direction of current flow respectively and the absolute value of the magnitude, not the sign, is relative to the minimum and maximum limits, as applicable, listed herein.

2/ The word "All" in the device type column means non-RHA limits for all device types. M, D, P, L, R, and F in the conditions column specify the postirradiation limits for those device types specified in the device type column.

3/ This test is guaranteed, if not tested, to the limits specified in table I.

4/ RHA samples do not have to be tested at -55°C and +125°C prior to irradiation.

5/ When performing postirradiation electrical measurements for RHA level, TA = +25°C. Limits shown are guaranteed at

TA = +25°C ±5°C.

6/ Transmission driving tests are performed at VCC = 5.5 V dc with a 2 ms duration maximum.

7/ Three-state output conditions are required. For IOZL, set outputs to high state. For IOZH, set outputs to low state. Set output enable control pins to VIL = VIL(MAX) and VIH = VIH(MIN), as required.