MIL-M-38510-507 Microcircuits, Memory, Digital, CMOS Ultraviolet Erasable Programmable Array Logic, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, erasable programmable array logic microcircuits which employ an EPROM cell as the programming element. Two product assurance classes B and S and a choice of case outlines and lead finishes are provided and are reflected in the complete part or identifying number PIN. For this product, the requirements of MIL-M-38510 have been

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MIL-M-38510/507B

TABLE II. Burn - in and electrical test requirements.

Line no.	MIL-PRF-38535 Test requirements	Class S devices 1/ 2/			Class B devices 1/ 2/
Line no.	MIL-PRF-38535 Test requirements	Reference paragraph	Table I 3/ subgroups	Table IX Delta 4/ limits	Reference paragraph	Table I 3/ subgroups	Table IX Delta 4/ limits
1	Interim electrical parameters		1			1
2	Static burn - in I	4.3b	Required
3	Same as line 1		1*	∆
4	Static burn - in II	4.3b	Required
5	Same as line 1		1*	∆
6	Dynamic burn - in	4.3b	Required		4.3b	Required
7	Same as line 1	4.3d	1*
8	Final electrical test parameters		1*, 2, 3, 7, 8, 9, 10, 11 5/	∆		1*, 2, 3, 7, 8, 9, 10, 11
9	Group A test requirements	4.4.1	1, 2, 3, 7, 8, 9, 10, 11		4.4.1	1, 2, 3, 7, 8, 9, 10, 11
10	Group B end-point electrical test parameters when using the method 5005 QCI option.	4.4.2	1, 2, 3, 7, 8, 9, 10, 11	∆
11	Group C end-point electrical test parameters		1, 2, 3, 7, 8, 9, 10, 11		4.4.3	1, 2, 3, 7, 8 5/ 6/	∆
12	Group D end-point electrical test parameters	4.4.4	1, 2, 3, 7, 8		4.4.4	1, 2, 3, 7, 8

1/ Blank spaces indicate tests are not applicable.

2/ For subgroups 9, 10, and 11 only the worst value measured per device need be recorded when variables data is required (e.g., during qualification).

3/ * indicates PDA applies to subgroup 1.

4/ ∆ indicates delta limit shall be required only on table IX, subgroup 1, where specified, and the delta values shall be computed with reference to the previous interim electrical parameters (line 1). Refer to table IX for required parameters and limits to be tested.

5/ The device manufacturer may at his option, either complete subgroup 1 electrical parameter measurements, including delta measurements, within 96 hours after burn-in completion (removal of bias); or may complete

subgroup 1 electrical measurements without delta measurements within 24 hours after burn-in completion

(removal of bias).

6/ For class B, delta limits shall be required on initial qualification or after any design changes which may affect the parameters listed in table IX. Delta values shall be computed with reference the previous interim electrical

parameters.