MIL-M-38510/5078
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein.
3.3.1 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3.2 Truth tables.
3.3.2.1 Unprogrammed or erased devices. The truth tables for unprogrammed devices shall be as specified on figure 2. When required in groups A, 8, C, or D (see 4.4), the devices shall be programmed by the manufacturer prior to test. A minimum of 50 percent of the total number of cells shall be programmed.
3.3.2.2 Programmed devices. The requirements for supplying programmed devices are not part of this specification.
3.3.3 Logic diagram. The logic diagram for unprogrammed devices shall be as specified on figure 3.
3.3.4 Case outlines. Case outlines shall be in accordance with 1.2.3 herein.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. Unless otherwise specified, the electrical performance characteristics are as specified in table I. The electrical tests for each subgroup are described in table I. Any additional detailed information or electrical test requirements not covered in table I (i.e., pin for pin conditions and testing sequence) shall be maintained and available upon request from the qualifying activity.
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535. For programmed devices, the altered item drawing number shall be added to the marking by the programming activity.
3.8 Processing EPLD's. All testing requirements and quality assurance provisions herein shall be satisfied by the manufacturer prior to delivery.
3.8.1 Erasure of EPLD's. When specified, devices shall be erased in accordance with the procedures and characteristics specified in 4.7.
3.8.2 Programmability of EPLD's. When, specified, devices shall be programmed to the specified pattern using the procedures and characteristics specified in 4.6.
3.8.3 Verification of erasure of programmability of EPLDS. When specified, devices shall be verified as either programmed to the specified pattern or erased. As a minimum, verification shall consist of performing a functional test (subgroup 7) to verify that all bits are in the proper state. Any bit that does not verify to be in the proper state shall constitute a device failure, and shall be removed from the lot.
3.9 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 42 (see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or function as described herein.
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535. Qualification data for subgroups 7and 8 shall be attributes only.
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