TABLE III. Group A inspection for device type 03 and 10.
Terminal conditions (pins not designated may be high � 2.0 V, low s 0.7 V, or open). 1/
* Terminal numbers for device type 03.
** Terminal numbers for device type 10.
1/ See 6.4 for special applications note.
2/ Case X and 2 pins not referenced are NC.
3/
- - - 2.5 V minumum/5.5 V maximum
0 V
4/
2.5 V minumum/5.5 V maximum
0 V
5/ IIL limits in mA are as follows:
IIL1 |
Min/Max limits for CKT |
||||
A |
B |
C |
D |
E |
|
-.075/-.250 |
-.030/-.300 |
-.150/-.560 |
-.120/-.360 |
-.120/-.360 |
IIL3 |
Min/Max limits for CKT |
||||
A |
B |
C |
D |
E |
|
-.150/-.500 |
-.060/-.600 |
-.250/-.560 |
-.240/-.720 |
-.280/-.760 |
IIL4 |
Min/Max limits for CKT |
||||
A |
B |
C |
D |
E |
|
-.200/-.800 |
-.060/-.700 |
-.290/-.650 |
-.120/-.720 |
-.320/-.800 |
6/ Input voltages shown are A = 2.0 volts minimum and B = 0.7 volts maximum.
7/ Tests shall be performed in sequence, attributes data only.
8/ Output voltages shall be H � 1.5 V and L < 1.5 V.
9/ fMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
10/ These tests may be performed as shown in table III or alternately as follows:
Test no. |
CLK1 |
K1 |
J1 |
PR1 |
Q1 |
Q1 |
Q2 |
GND |
Q2 |
PR2 |
J2 |
K2 |
CLK2 |
CLR2 |
CLR1 |
VCC |
98A |
2.7 V |
2.7 V |
2.7 V |
2/ |
OUT |
GND |
IN |
5.0 V |
||||||||
99A |
2.7 V |
2.7 V |
2.7 V |
IN |
OUT |
" |
2/ |
" |
||||||||
100A |
OUT |
" |
2/ |
2.7 V |
2.7 V |
2.7 V |
IN |
" |
||||||||
101A |
" |
OUT |
IN |
2.7 V |
2.7 V |
2.7 V |
2/ |
" |
||||||||
102A |
" |
OUT |
2/ |
2.7 V |
2.7 V |
2.7 V |
IN |
" |
||||||||
103A |
OUT |
" |
IN |
2.7 V |
2.7 V |
2.7 V |
2/ |
" |
||||||||
104A |
2.7 V |
2.7 V |
2.7 V |
2/ |
OUT |
" |
IN |
" |
||||||||
105A |
2.7 V |
2.7 V |
2.7 V |
IN |
OUT |
" |
2/ |
" |
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