TABLE lll. Group A inspection for device type 01 and 08 - Continued. Terminal conditions (pins not designated may be high � 2.0 V, low s 0.7 V, or open).
4/ llL limits in mA are as follows:
llL1 |
Min/Max limits for CKT |
||||
A |
B |
C |
D |
E |
|
-.075/-.250 |
-.03/-.30 |
-.11/-.25 |
-.12/-.36 |
-.12/-.36 |
|
llL3 |
Min/Max limits for CKT |
||||
A |
B |
C |
D |
E |
|
-.15/-.60 |
-.06/-.60 |
-.15/-.56 |
-.29/-.72 |
-.24/-.72 |
|
llL4 |
Min/Max limits for CKT |
||||
A |
B |
C |
D |
E |
|
-.16/-.70 |
-.06/-.70 |
-.29/-.65 |
-.20/-.80 |
-.12/-.72 |
|
5/ lOS limits are as follows:
Test nos. 46 and 48: CKT's A, B, C - -7.5/-50
CKT D - -15/-100
6/ lnput voltages shown are A = 2.0 volts minimum and B = 0.7 volts maximum.
7/ Tests shall be performed in sequence, attributes data only.
8/ Output voltages shall be H � 1.5 V and L < 1.5 V.
9/ These tests may be performed as shown in table lll or alternately as follows:
Test no. |
CLK1 |
CLR1 |
K1 |
VCC |
CLK2 |
CLR2 |
J2 |
Q2 |
Q2 |
K2 |
GND |
Q1 |
Q1 |
J1 |
72A |
A |
A |
A |
4.5 V |
B |
A |
A |
H |
L |
A |
GND |
L |
H |
A |
72B |
B |
" |
" |
" |
B |
" |
" |
H |
L |
" |
" |
H |
L |
" |
72C |
B |
" |
" |
" |
A |
" |
" |
H |
L |
" |
" |
H |
L |
" |
78A |
A |
" |
" |
" |
B |
" |
" |
L |
H |
" |
" |
H |
L |
" |
78B |
B |
" |
" |
" |
B |
" |
" |
L |
H |
" |
" |
L |
H |
" |
78C |
B |
" |
" |
" |
A |
" |
" |
L |
H |
" |
" |
L |
H |
" |
10/ fMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
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