TABLE lll. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be high � 2.0 V, low s 0.7 V, or open).
1/ Case X and 2 pins not referenced are NC.
2/ - - - 2.5 V minumum/5.5 V maximum
0 V
3/ llL limits in mA are as follows:
llL4 |
Min/Max limits for CKT |
|||||
A |
B |
C |
D |
E |
F |
|
-.150/-.500 for tests 27, 30 -.200/-.800 for tests 28, 29 |
-.060/-.700 |
-.160/-.400 for tests 27, 30 -.350/-.760 for tests 28, 29 |
-.160/-.400 for tests 27, 30 -.355/-.759 for tests 28, 29 |
-.120/-.360 for tests 27, 30 -.280/-.760 for tests 28, 29 |
-.320/-.800 (All) |
llL5 |
Min/Max limits for CKT |
|||||
A |
B |
C |
D |
E |
F |
|
-.200/-.800 |
-.060/-.700 |
-.350/-.760 |
-.480/-1.200 |
-.280/-.760 |
-.480/-1.200 |
4/ - - - 2.5 V minumum/5.5 V maximum
0 V
5/ lnput voltages shown are A = 2.0 volts minimum and B = 0.7 volt maximum.
6/ Tests shall be performed in sequence, attributes data only.
7/ Output voltages shall be H � 1.5 V and L < 1.5 V.
8/ fMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
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