TABLE III. Group A inspection for device type 05. 11
Subgroup |
Symbol |
MIL- STD-883 method |
Cases A,B,D |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Measured terminal |
Limits |
Unit |
|
Case C |
9 |
10 |
13 |
14 |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
11 |
11 |
Min |
Max |
|||||
Test no. |
K1A |
K1B |
Clock |
VCC |
J1A |
J1B |
J2A |
J2B |
Preset |
Q |
GND |
Q |
K2A |
K2B |
|||||||
10 TC=+125°C |
fMAX 61 |
(Fig. 13) |
80 81 |
2.4 V " |
2.4 V " |
IN " |
5.0 V " |
2.4 V " |
2.4 V " |
2.4 V " |
2.4 V " |
5.0 V 5.0 V |
OUT |
GND " |
OUT |
2.4 V " |
2.4 V " |
Q Q |
30 30 |
MHz MHz |
|
tPLH1 |
3003 (Fig. 13) |
82 83 |
" " |
" " |
" " |
" " |
" " |
" " |
" " |
" " |
IN IN |
OUT |
" " |
OUT |
" " |
" " |
Preset to Q Preset to Q |
2 " |
28 28 |
ns " |
|
tPLH2 |
3003 (Fig. 13) |
84 85 |
" H |
" " |
" " |
" " |
H 2.4 V |
" " |
GND " |
GND " |
OUT |
" " |
OUT |
GND " |
GND " |
Clock Q Clock Q |
" " |
23 23 |
" " |
||
tPHL2 |
86 87 |
L 2.4 V |
" " |
" " |
" " |
2.4 V M |
" " |
" " |
" " |
OUT |
" " |
OUT |
" " |
" " |
Clock Q Clock Q |
" " |
28 28 |
" " |
|||
11 |
Same tests, terminal conditions, and limits as subgroup 10, except TC=-55°C |
A = Normal clock pulse.
D = Momentary 4.5 V, then GND. H = tsetup waveform, see figure 13. L = tsetup waveform, see figure 13. M = tsetup waveform, see figure 13.
* = Duration of test should not exceed 1 second.
** = Limit duration of this test to 100 ns.
11 Terminal conditions (pins not designated may be H � 2.0 V, or L ≤ 0.8 V, or open).
21 The clock Input shall be 4.5 V with a momentary low pulse, then 4.5 V 4.5 V .
0 V
31 Tests shall be performed in sequence.
41 Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum.
51 Output voltages shall be either: a. H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or b.
H � 1.5 V and L ≤ 1.5 V when using a high speed checker single comparator.
61 fMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
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