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MIL-M-38510-13 Microcircuits, Digital, Bipolar, Ttl, Counters Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, TTL, binary and decade counters. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16 - 17 - 18 - 19 - 20 - 21 - 22 - 23 - 24 - 25 - 26 - 27 - 28 - 29 - 30 - 31 - 32 - 33 - 34 - 35 - 36 - 37 - 38 - 39 - 40 - 41 - 42 - 43 - 44 - 45 - 46 - 47 - 48 - 49 - 50 - 51 - 52 - 53 - 54 - 55 - 56 - 57 - 58 - 59 - 60 - 61 - 62 - 63 - 64 - 65 - 66 - 67 - 68 - 69 - 70 - 71 - 72 - 73 - 74 - 75 - 76 - 77 - 78 - 79 - 80 - 81 - 82 - 83 - 84 - 85 - 86 - 87 - 88 - 89 - 90 - 91



TABLE III.  Group A inspection for device type 01 - Continued.

Terminal conditions 13/


Subgroup


Symbol

MIL- STD-883 method

Case A,B,D

1

2

3

4

5

6

7

8

9

10

11

12

13

14


Meas. terminal

Test limits

Case C

1

2

3

4

5

6

7

8

9

10

11

12

13

14


Min


Max


Unit

Test No.

In BC

NC

NC

NC


VCC


R0(1)


R0(2)

QD

QC

GND

QB

QA

NC

In A

9


TC = 25°C

9/

FMAX


tPLH1


tPHL1

Fig 5 "

"

66


67


68


10/


10/

5.0 V "

"

GND "

"

GND "

"

12/ OUT 11/

OUT 11/

12/


11/


11/

GND "

"

12/


11/


11/

OUT 11/


10/ 11/


10/ 11/

IN "

"

QA QD

QD

10


20


20


100


100

MHz ns

ns

10


TC = 125°C

9/

FMAX


tPLH1


tPHL1

Fig 5 "

"

69


70


71


10/


10/

" "

"

" "

"

" "

"

12/ OUT 11/

OUT 11/

12/


11/


11/

" "

"

12/


11/


11/

OUT 11/


10/ 11/


10/ 11/

IN "

"

QA QD

QD

10


20


20


115


115

MHz ns

ns

11

Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.


1/  Momentarily apply 2.4 V, then ground prior to taking measurements to set the device in desired state.  Maintain ground for measurement.

2/  Apply 4.5 V pulse then ground prior to taking measurements to set the device in the desired state.  Maintain ground for measurement.

3/  A � 2.0 V, B ≤ 0.8 V.  Input voltages shown are the maximum for VIL and the minimum for VIH.

4/  Only a summary of attributes data is required.

5/  Output voltages shall be either:

(a)  H = 2.4 volts minimum and L = 0.4 volt maximum when using a high speed checker double comparator, or

(b)  H � 1.5 volts and L ≤ 1.5 volts when using a high speed checker single comparator.

6/  Input must be applied 3 times after R0 pulses.

7/  Input must be applied 2 times after R0 pulses.

8/  Input must be applied once after R0 pulses.

9/  FMAX, minimum limit specified is the frequency of the input pulse.  The output frequency shall be one-half of the input frequency.

10/  Connect terminals together during test.

11/  See test figure 5 for terminal load.

12/  Omit specified loads for this test.

13/  Terminal conditions (pins not designated may be H � 2.0 V, or L ≤ 0.8 V, or open).

14/  The limits shown shall be as follows:


Min/Max limits (ma) for circuit:

Test

A

B

C

D

E

IIL1

-0.4/-1.3

-0.4/-1.3

-0.3/-1.3

-0.7/-1.6

-0.7/-1.6

IIL2

-1.4/-3.2

-0.7/-3.2

-0.7/-3.2

-0.7/-3.2

-0.7/-3.2

IIL3

-1.4/-4.8

-0.7/-4.8

-0.7/-4.8

-1.4/-6.4

-1.4/-6.4




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