TABLE III. Group A inspection for device type 10 - Continued.
Subgroup |
Symbol |
MIL- STD- 883 method |
Test no. |
Pin number and signal designation |
Measured terminal |
Limits |
Unit |
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1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
17 |
18 |
Min |
Max |
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IN1 |
IN2 |
IN3 |
IN4 |
IN5 |
IN6 |
IN7 |
IN8 |
GND |
COM |
OUT8 |
OUT7 |
OUT6 |
OUT5 |
OUT4 |
OUT3 |
OUT2 |
OUT1 |
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1 TA = +25°C |
IIN(off) |
41 42 43 44 45 46 47 48 |
25 µA |
25 µA |
25 µA |
25 µA |
25 µA |
25 µA |
25 µA |
25 µA |
0 v " " " " " " " |
50 v |
50 v |
50 v |
50 v |
50 v |
50 v |
50v |
50 v |
OUT1 OUT2 OUT3 OUT4 OUT5 OUT6 OUT7 OUT8 |
500 " " " " " " " |
µA " " " " " " " |
|||
vIN(on) |
49 50 51 52 53 54 55 56 |
2.4 v |
2.4 v |
2.4 v |
2.4 v |
2.4 v |
2.4 v |
2.4 v |
2.4 v |
" " " " " " " " |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
OUT1 OUT2 OUT3 OUT4 OUT5 OUT6 OUT7 OUT8 |
2.0 " " " " " " " |
v " " " " " " " |
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IR |
57 58 59 60 61 62 63 64 |
0 v " " " " " " " |
50 v " " " " " " |
0 v |
0 v |
0 v |
0 v |
0 v |
0 v |
0 v |
0 v |
COM COM COM COM COM COM COM COM |
10.0 " " " " " " " |
µA " " " " " " " |
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vF |
65 66 67 68 69 70 71 72 |
" " " " " " " " |
0 v " " " " " " " |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
OUT1 OUT2 OUT3 OUT4 OUT5 OUT6 OUT7 OUT8 |
2.0 " " " " " " " |
v " " " " " " " |
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hFE |
3003 |
73 74 75 76 77 78 79 80 |
IB1 |
IB2 |
IB3 |
IB4 |
IB5 |
IB6 |
IB7 |
IB8 |
" " " " " " " " |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
IB1-OUT1 IB2-OUT2 IB3-OUT3 IB4-OUT4 IB5-OUT5 IB6-OUT6 IB7-OUT7 IB8-OUT8 |
1000 " " " " " " " |
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