TABLE III. Group A inspection for device type 01 - Continued.
Subgroup |
Symbol |
MIL- STD- 883 method |
Test no. |
Pin number and signal designation |
Measured terminal |
Limits |
Unit |
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1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
Min |
Max |
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IN1 |
IN2 |
IN3 |
IN4 |
IN5 |
IN6 |
IN7 |
GND |
COM |
OUT7 |
OUT6 |
OUT5 |
OUT4 |
OUT3 |
OUT2 |
OUT1 |
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3 TA = -55°C |
vCE(sat) |
3007 |
127 128 129 130 131 132 133 |
550 µA |
550 µA |
550 µA |
550 µA |
550 µA |
550 µA |
550 µA |
0 v " " " " " " |
200 mA |
200 mA |
200 mA |
200 mA |
200 mA |
200 mA |
200 mA |
OUT1 OUT2 OUT3 OUT4 OUT5 OUT6 OUT7 |
1.5 " " " " " " |
v " " " " " " |
||
vCE(sat) |
3007 |
134 135 136 137 138 139 140 |
350 µA |
350 µA |
350 µA |
350 µA |
350 µA |
350 µA |
350 µA |
" " " " " " " |
100 mA |
100 mA |
100 mA |
100 mA |
100 mA |
100 mA |
100 mA |
OUT1 OUT2 OUT3 OUT4 OUT5 OUT6 OUT7 |
1.3 " " " " " " |
v " " " " " " |
|||
IIN(off) |
141 142 143 144 145 146 147 |
25 µA |
25 µA |
25 µA |
25 µA |
25 µA |
25 µA |
25 µA |
" " " " " " " |
50 v |
50 v |
50 v |
50 v |
50 v |
50v |
50 v |
OUT1 OUT2 OUT3 OUT4 OUT5 OUT6 OUT7 |
500 " " " " " " |
µA " " " " " " |
||||
IR |
148 149 150 151 152 153 154 |
" " " " " " " |
50 v " " " " " " |
0 v |
0 v |
0 v |
0 v |
0 v |
0v |
0 v |
COM COM COM COM COM COM COM |
10.0 " " " " " " |
µA " " " " " " |
||||||||||
vF |
155 156 157 158 159 160 161 |
0 v " " " " " " |
0 v " " " " " " |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
OUT1 OUT2 OUT3 OUT4 OUT5 OUT6 OUT7 |
2.0 " " " " " " |
v " " " " " " |
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hFE |
3003 |
162 163 164 165 166 167 168 |
IB1 |
IB2 |
IB3 |
IB4 |
IB5 |
IB6 |
IB7 |
" " " " " " " |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
IB1-OUT1 IB2-OUT2 IB3-OUT3 IB4-OUT4 IB5-OUT5 IB6-OUT6 IB7-OUT7 |
500 " " " " " " |
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