TABLE III. Group A inspection for device type 06 - Continued.
Subgroup |
Symbol |
MIL- STD- 883 method |
Test no. |
Pin number and signal designation |
Measured terminal |
Limits |
Unit |
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1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
17 |
18 |
Min |
Max |
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IN1 |
IN2 |
IN3 |
IN4 |
IN5 |
IN6 |
IN7 |
IN8 |
GND |
COM |
OUT8 |
OUT7 |
OUT6 |
OUT5 |
OUT4 |
OUT3 |
OUT2 |
OUT1 |
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2 TA = +125°C |
hFE |
3003 |
121 122 123 124 125 126 127 128 |
IB1 |
IB2 |
IB3 |
IB4 |
IB5 |
IB6 |
IB7 |
IB8 |
0 V " " " " " " " |
0 V " " " " " " " |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
IB1-OUT1 IB2-OUT2 IB3-OUT3 IB4-OUT4 IB5-OUT5 IB6-OUT6 IB7-OUT7 IB8-OUT8 |
1000 " " " " " " " |
||
3 TA = -55°C |
ICEX |
129 130 131 132 133 134 135 136 |
0 V " " " " " " " |
50 V |
50 V |
50 V |
50 V |
50 V |
50 V |
50 V |
50 V |
OUT1 OUT2 OUT3 OUT4 OUT5 OUT6 OUT7 OUT8 |
10.0 " " " " " " " |
µA " " " " " " " |
|||||||||||
VCE(sat) |
3007 |
137 138 139 140 141 142 143 144 |
850 µA |
850 µA |
850 µA |
850 µA |
850 µA |
850 µA |
850 µA |
850 µA |
" " " " " " " " |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
350 mA |
OUT1 OUT2 OUT3 OUT4 OUT5 OUT6 OUT7 OUT8 |
1.8 " " " " " " " |
V " " " " " " " |
|||
VCE(sat) |
3007 |
145 146 147 148 149 150 151 152 |
550 µA |
550 µA |
550 µA |
550 µA |
550 µA |
550 µA |
550 µA |
550 µA |
" " " " " " " " |
200 mA |
200 mA |
200 mA |
200 mA |
200 mA |
200 mA |
200 mA |
200 mA |
OUT1 OUT2 OUT3 OUT4 OUT5 OUT6 OUT7 OUT8 |
1.5 " " " " " " " |
V " " " " " " " |
|||
VCE(sat) |
3007 |
153 154 155 156 157 158 159 160 |
350 µA |
350 µA |
350 µA |
350 µA |
350 µA |
350 µA |
350 µA |
350 µA |
" " " " " " " " |
100 mA |
100 mA |
100 mA |
100 mA |
100 mA |
100 mA |
100 mA |
100 mA |
OUT1 OUT2 OUT3 OUT4 OUT5 OUT6 OUT7 OUT8 |
1.3 " " " " " " " |
V " " " " " " " |
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