MIL-M-38510-140 Microcircuits, Linear, Monolithic And Hybrid Silicon, Microprocessor Compatible, 12 Bit Analog-To-Digital ConvertersThis specification covers the detail requirements for monolithic and hybrid, microprocessor compatible, 12-bit successive approximation analog-to-digital converters buffered outputs. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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Subgroup

Symbol

Test no.

Applied voltages ref. pin 9 (figures 6, 8)

Applied digital code-word

DUT digital output

code-word

Active relays

Measurement sense lines ref. pin 9

Equation and notes

Limits

Units

Min

Max

7

VCC

(V)

11

VEE

(V)

1

VDD

(V)

29 <-------------> 40

MSB <------------> LSB

29 <-------------> 16

MSB <------------> LSB

Pin

Value

Unit

7

TA =

+25°C

577

578

+15.0 "

-15.0 "

+5.0 "

1111 1111 1110

0000 0000 0000

1111 1111 111>

0000 0000 000>

KA "

13 "

E754

E755

V "

For end-point linearity error,

LE(N) = (E(N+754)+E(N+755)) / 2-V(ideal)) / S V(ideal) = N1* S+E755-S/2

N1 = Applied ref DAC code-word

S = (E754-E755) / 4094

Determine the code-word and the value of the maximum positive Linearity Error for all combinations of the digital input code words from (0000 0000 0000) to

(1111 1111 1111).

0

+0.5

LSB

LEmp

579

+15.0

-15.0 "

+5.0 "

<-----(N1-1)----->

<-----(N-1)----->

<-----(N-1)----->

<-----(N)----->

KA "

13 "

E756

E757

V "

LEmp = (E756+E757) / 2-N1*S-E755+S / 2) / S All device types

Determine the code-word and the value of the maximum negative Linearity Error for all combinations of the digital input code words from (0000 0000 0000) to

(1111 1111 1111).

-0.5

0

LSB

LEmn

580

+15.0

-15.0 "

+5.0 "

<-----(N1-1)----->

<-----(N-1)----->

<-----(N-1)----->

<-----(N)----->

KA "

13 "

E758

E759

V "

LEmn = (E758+E759) / 2-N1*S-E755+S / 2) / S All device types

For Linearity Error, the worst positive and negative error values, as determined by the manufacturer's abbreviated Integral Linearity Error (LE) test procedure for subgroup 4 shall be within 150 milliLSB of the worst positive and negative error values, as determined by the all codes test.