MIL-M-38510/140A
TABLE II. Electrical test requirements.
|
MIL-PRF-38535 test requirements |
Subgroups (see table III) 1/ |
|
Class S devices |
Class B 2/ devices |
|
Interim electrical parameters |
1 |
1 |
Final electrical test parameters |
1*, 2, 3, 4, 5, 6 |
1*, 2, 3, 4, 5, 6 |
Group A test requirements |
1, 2, 3, 4, 5 ,6, 7, 8, 9 |
1, 2, 3, 4, 5 ,6, 7, 8, 9 |
Group B electrical test parameters when using the method 5005 QCI option |
1, 4 and table IV delta limits |
N/A |
Group C end-point electrical parameters |
1, 4 and table IV delta limits |
1, 4 and table IV delta limits |
Additional electrical subgroups for Group C periodic inspections |
N/A |
--- |
Group D end-point electrical parameters |
1, 2, 3, 4, 5, 6 |
1, 4 |
1/ PDA applies to subgroup 1.
2/ Subgroup 8, as listed in table III, test 581 through test 588 is used for initial and redesign qualification (class B only).
4. VERIFICATION.
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or function as function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and quality conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883.
For class S devices, dynamic tests (test condition D) using the manufacturer's burn-in circuit. For class B devices, test condition D, using the manufacturer's burn-in circuit.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535.
d. Internal visual inspection (methods 2010 and 2017 (multi-chip criteria) of MIL-STD-883).
For multichip devices, internal visual inspection shall be performed for each chip within the package.
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