MIL-M-38510-140 Microcircuits, Linear, Monolithic And Hybrid Silicon, Microprocessor Compatible, 12 Bit Analog-To-Digital ConvertersThis specification covers the detail requirements for monolithic and hybrid, microprocessor compatible, 12-bit successive approximation analog-to-digital converters buffered outputs. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/140A

Test setup timing specifications

CONVERT MODE

Symbol	Parameter	Min	Unit
tHEC	CE pulse width	300	ns
tSSC	CS to CE setup	300	ns
tHSC	CS low during CE high	200	ns
tSRC	R/ C to CE setup	250	ns
tHRC	R/ C low during CE high	200	ns
tSAC	A0 to CE setup	0	ns
tHAC	A0 valid during CE high	300	ns

READ MODE

Symbol	Parameter	Min	Unit
tSSR	CS to CE setup	150	ns
tSRR	R/ C to CE setup	0	ns
tSAR	A0 to CE setup	150	ns
tHSR	CS valid after CE low	50	ns
tHRR	R/ C high after CE low	0	ns
tHAR	A0 valid after CE low	50	ns

NOTES:

1. Test parameter tDD is measured with the following load circuit and the access time is defined as the time required for an output to reach 0.4 V and 2.4 V for VOL and VOH, respectively.

2. Test parameters tHL and tHD are measured with the following load circuit and the float delay time

are defined as the time required for an output to reach 0.8 V to 2.0 V from a logic "0" and from a logic "1".,

respectively.

FIGURE 8. Timing diagrams (system controlled operation) - Continued.