MIL-M-38510-110 Microcircuits, Linear, Quad Operational Amplifiers, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, quad operational amplifiers. Two product assurance classes and a choice of case outlines and lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/110C

TABLE III.  Group A inspection - Continued.

1/    Use table III in conjunction with the following:

2/    K1, K2, K3, or K4 relay will also be energized as follows:

a.    Device types 01 through 04 - test numbers 22 and 103 through 126. b.    Device types 05 and 06 - test numbers 20 and 100 through 123.

3/    The equations take into account both the closed loop gain of 1,000 and the scale factor multiplier so that the calculator value is in table I units; therefore, use the measured value units in the equation.

(For example:  If E1 = 2 V and VIO = E1, then VIO = E1, then VIO = 2 mV).

4/    Each device shall be tested over the common mode range as specified in table III with the output forced to the worse case condition.  VCM is achieved by grounding the inputs and algebraically subtracting VCM from each

supply.  Common mode rejection is calculated using the offset voltage values measured at the common mode

range end points.

5/    In device types 01 through 04, to minimize thermal drift, the reference voltage for gain measurement (E3, E21, and

E39) shall be taken immediately prior to or after the reading corresponding to device gain (E55, E56, E57, E58, E63, E64, E65, E66, E71, E72, E73, and E74).

6/    Only one amplifier shall be tested at one time and its output shall be shorted to ground for 25 ms or less.

7/    Each amplifier shall be tested separately, except for the ICC measurements where all the amplifiers shall be connected as grounded followers (relays K1 through K4 de-energized).

8/    Tests 27, 32, 51, and 56 for devices types 01 through 04 and tests 25, 30, 47, and 52 for device types 05 and 06, which require a read and record measurement plus a calculation, may be omitted except when subgroups 2 and

3 are being accomplished for group A sampling inspection and groups C and D end point measurement.

9/    SR(+) and SR(-) are 0.2 V/μs for device type 01 and 0.8 V/μs for device type 02.

10/  Broadband noise (NI(BB) shall be measured using an rms voltmeter with a bandwidth of 10 Hz to 5 kHz. "Popcorn" noise (NI(PC)) shall be measured for 15 seconds.

11/  For device types 01, 03, and 04, VIN = 10 V; for device type 02, VIN = 2 V.

12/  For device types 01, 03, and 04, VIN = -10 V; for device type 02, VIN = -2 V.

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