MIL-M-38510/110C
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract award (see 4.3 and
6.4).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein.
3.3.1 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3.2 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity upon request upon request.
3.3.3 Case outlines. The case outlines shall be as specified in 1.2.3.
3.3.4 Packaging and sealing material. Package and sealing material shall be in accordance with MIL-PRF-38535.
3.4 Lead material and finish. Lead material and finish shall be in accordance with MIL-PRF-38535.
3.5 Electrical performance characteristics. The following electrical performance characteristics are as specified in table I, and apply over the full ambient operating temperature range of -55°C to +125°C and for supply voltages as follows.
Unless otherwise specified, source resistance (RS) shall be 50 ν for all tests.
Device types 01, 02, 03, and 04 will have a dual power supply with ±VCC (min) at ±5 V and ±VCC (max) at ±20 V. Device types 05 and 06 will have a single power supply with ±VCC (min) at ±5 V and ±VCC (max) at ±30 V.
3.5.1 Instability oscillations. The devices shall be free of oscillations when operated in the test circuits of this specifications.
3.6 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups specified in table
II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 49 (see
MIL-PRF-38535, appendix A).
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