MIL-M-38510/657A
4.5 Methods of inspection. Methods of inspection shall be specified and as follows:
4.5.1 Voltage and current. Unless otherwise specified, all voltages given are referenced to the microcircuit GND
terminal. Currents given are conventional current and positive when flowing into the referenced terminal.
4.5.2 Burn-in and life test cool down procedures. When the burn-in and life tests are completed and prior to removal of bias voltages, the devices under test (DUT) shall be cooled to within 10°C of their power stable condition at room temperature; then, electrical parameter end-point measurements shall be performed.
TABLE IV. Delta limits at 25°C.
Parameter 1/ |
Device types |
|
All |
||
ICC |
±30 nA |
1/ The above parameters shall be recorded before and after the required burn-in and life tests to determine deltas (�).
4.5.3 Quiescent supply current (ICC test). When performing quiescent supply current measurements (ICC), the meter shall be placed so that all currents flow through the meter.
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the
contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging
requirements are maintained by the Inventory Control Point's packaging activity within the Military Service or Defense Agency, or within the military service's system commands. Packaging data retrieval is available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity.
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