MIL-M-38510-135 Microcircuits, Linear, Low Offset Operational Amplifiers, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, low offset operational amplifiers. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.4.

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TABLE III.  Group A inspection for device types 03, 04, 05, and 06 - Continued.

11   All tests apply to figure 3, unless otherwise specified.  For devices marked with the "Q" certification mark, the parameters listed herein may be guaranteed if not tested to the limits specified in accordance with the manufacturer's QM plan.

21   IIO is calculated using data from previous tests.

31   IOS(+) and IOS(-) are measured with the output shorted to ground for less than 25 milliseconds.

41   ΔVIO1Δt is calculated using data from previous tests.

51   Slew rate can be measured using figure 5.  All test signals for figure 3 are shown on figure 5.

61   The oscillation detector will be disconnected during slew rate tests.

71   Slew rate:  For device types 03, 04, and 06 energize relays K4 and K9.  For device type 05 energize relays K4, K9, and K10.