MIL-M-385101135G
TABLE I. Electrical performance characteristics - Continued.
Test |
Symbol |
Conditions 11 ±VCC = ±15 V, unnulled, see figure 3 and reference 3.5 herein, unless otherwise specified |
Device type |
Limits |
Unit |
|
Min |
Max |
|||||
Low frequency input noise voltage |
Enpp |
fO = 0.1 Hz to 10 Hz, TA = +25°C, see figure 7 |
01,02 |
0.6 |
µVPP |
|
03,05 |
0.18 |
|||||
06 |
0.375 |
|||||
04 |
0.20 |
|||||
Input noise current density |
In |
fO = 10 Hz, TA = +25°C, see figure 6 |
03,04, 05 |
5.66 |
pA 1 Hz |
|
06 |
35 |
|||||
fO = 100 Hz, TA = +25°C, see figure 6 |
03,05 |
1.88 |
||||
04 |
2.1 |
|||||
06 |
18 |
|||||
fO = 1 kHz, TA = +25°C, see figure 6 |
03,05 |
0.84 |
||||
04 |
0.89 |
|||||
06 |
5 |
11 For devices marked with the "Q" certification mark, the parameters listed herein shall be guaranteed if not tested to the limits specified in accordance with the manufacturer's QM plan.
21 Tested at VCM = 0 V, VCC = ±15 V.
31 Due to the inherent warm-up drift of types 01, 03, 04, 05, and 06, testing shall occur no sooner than 5 minutes
after application of power.
41 Refer to table IV for end-point parameters.
51 Continuous short circuit limits are considerably less than the indicated test limits since maximum power dissipation cannot be exceeded.
61 For device type 04, ICC is for each amplifier.
71 VOUT = 0 to +10 for AVS(+) and VOUT = 0 to -10 for AVS(-). RL = 2,000 n.
3.6 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification sheet shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A).
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