MIL-M-38510-135 Microcircuits, Linear, Low Offset Operational Amplifiers, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, low offset operational amplifiers. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.4.

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MIL-M-38510/135G

NOTES:

1. All resistors are ±0.1% tolerance and all capacitors are ±10% unless specified otherwise.

2. Precautions shall be taken to prevent damage to the OUT during insertion into socket and change of

relay state (example: disable voltage supplies and current limit ±VCC).

3. Compensation capacitors should be added as required for test circuit stability. Proper wiring procedures

shall be followed to prevent unwanted coupling and oscillations. Loop response and settling time

shall be consistent with the test rate such that any value has settled for at least five loop time constants before the value is measured.

4. Adequate settling time should be allowed such that each parameter has settled to within five percent of its

final value.

5. All relays are shown in the normal de-energized state.

6. Saturation of the nulling amp is not allowed on tests where the pin 4 value is measured.

7. The load resistors 1,000 n and 2,050 n yield effective load resistance of 100 n and 2,000 n respectively.

8. Any oscillation greater than 300 mV pk-pk in amplitude shall be cause for device failure.

9. Oevice type 04 only, test both halves for all tests. The idle half of the dual amplifiers shall be maintained in this configuration where V1 is midway between +VCC and -VCC, or the manufacturer has the option to

connect the idle half in a VIO configuration such that the inputs are maintained at the same common mode

voltage as the OUT.

10. Circuit within dashed area used for devices 03, 04, 05, and 06 only.

11. For devices 01 and 02: R1 = 500 kn ±.01%; R2 = 500 kn ±.01%.

For device 03, 04, 05, and 06: R1 = 50 kn ±.01%; R2 = 50 kn ±.01%.

12. When using this test circuit for measuring slew rate, the oscillation detector shall be disabled.

13. For devices 01 and 02: R3 = 27 kn, ±5%, R4 = 100 kn, ±5%.

For devices 03, 04, 05, and 06: R3 = 0 n, R4 = 10 kn, ±5%.

FIGURE 3. Test circuit for static and slew rate tests - Continued.