MIL-M-38510-133 Microcircuits, Linear, 10-Bit Digital-To-Analog Converter, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, 10-bit binary digital-to-analog converters containing deposited thin film resistor networks. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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MIL-M-38510/133B

TABLE II. Electrical test requirements.

MIL-PRF-38535 test requirements	Subgroups (see table III)
MIL-PRF-38535 test requirements	Class S devices	Class B devices
Interim electrical parameters	1	1
Final electrical test parameters	1*, 2, 3	1*, 2, 3
Group A test requirements	1,2,3,7,8,12	1,2,3,7,8,12
Group B electrical test parameters when using the method 5005 QCI option	1,2,3 and table IV delta limits	N/A
Group C end-point electrical parameters	1,2,3 and table IV delta limits	1 and table IV delta limits
Additional electrical subgroups for group C periodic inspections	N/A	----
Group D end-point electrical parameters	1,2,3,	1

* PDA applies to subgroup 1.

4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.

4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with

MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).

4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:

a. Tests shall be as specified in table II herein.

b. Subgroups 4, 5, 6, 9, 10, and 11 shall be omitted.

c. Subgroup 12 shall be added to group A inspection for all classes and it shall consist of the conditions

and limits as specified in table III. The sample size series number shall be 15 for all classes (accept on 0).

4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.