MIL-M-38510-133 Microcircuits, Linear, 10-Bit Digital-To-Analog Converter, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, 10-bit binary digital-to-analog converters containing deposited thin film resistor networks. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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MIL-M-38510/133B

TABLE I. Electrical performance characteristics - Continued.

1/ VCC = +15 V, VEE = -15 V, Logic "0" = 4.5 V (max), Logic "1" = 10.5 V (min), unipolar and bipolar application, see figure 2, unless otherwise specified. See 6.5 for symbols and definitions.

2/ BPOE is the error in the -5 V OUT output voltage when the device is operated in the bipolar mode with all digital bits off.

3/ The gain error of a 10-bit O/A converter corresponds to a zero-scale to full-scale range error in LSB units

(i.e. ±0.5% x 1024 LSB/100% = ±5.12 LSB).

4/ This test is performed in the unipolar mode over a 0 to 10 V range. The unipolar scale factor is 1024 LSB/10 V = 102.4 LSB/V.

5/ The manufacturer has the option of testing devices at all digital input codes or an abbreviated series of codes. The abbreviated test should have a sufficient number of codes with or without limit guard banding such that an "all-codes" test will not fail a device which passed the abbreviated test.

6/ The limit 160 µV rms over a 100 kHz bandwidth will result in less than � LSB peak noise over a 4 MHz noise bandwidth.