MIL-M-38510-125 Microcircuits, Linear, Sample And Hold Circuits, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, sample and hold circuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16 - 17 - 18 - 19 - 20 - 21 - 22 - 23 - 24 - 25 - 26 - 27 - 28 - 29 - 30 - 31 - 32 - 33 - 34 - 35 - 36 - 37 - 38 - 39

MIL-M-38510/1258

NOTES:

1. At 125°C hold mode leakage current causes excessive droop rate of the hold capacitor voltage. (For example: maximum droop rate = 11 / 1t = I / C = 100 nA / 0.01 µF = 10 m1 / ms)

2. In order to minimize the droop error, the test fixture S/H at 25°C is used to acquire and hold the voltage until the measurement system can do its function.

3. See figure 3 test circuit.

FIGURE 19. 125°C D.U.T. hold mode measurements.