MIL-M-38510-125 Microcircuits, Linear, Sample And Hold Circuits, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, sample and hold circuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4

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MIL-M-38510/1258

NOTES:

1. Acquisition time is equal to the logic sample pulse width which yields an output error from steady state of 10 mV at the device under test (D.U.T.) output or 1 V at the differential amp output (for example;

pulse width t = taq when E1 - E2 = 0.1 V).

2. Only the 0 V to +10 V step is shown. The other transitions as per figure 10 shall also be tested.

FIGURE 9. Acquisition time test circuit and wavforms.