MIL-M-38510/125B
TABLE I. Electrical performance characteristics - Continued.
Test |
Symbol |
Conditions -55°C ≤ TA ≤ +125°C ±VCC = ±15 V, see figure 7 and 3.5 unless otherwise specified |
Device type |
Limits |
Unit |
|
Min |
Max |
|||||
Transient response 9/ (settling time) |
TR(ts) |
VIN = 100 mV step, TA = +25°C, CH = 1000 pF, RL = 10 kn, CL = 100 pF, see figure 16, to 10% of final value, |
01,02 |
2.5 |
µs |
|
Transient response 9/ (overshoot) |
TR(os) |
VIN = 100 mV step, TA = +25°C, CH = 1000 pF, RL = 10 kn, CL = 100 pF, see figure 16 |
01,02 |
40 |
% |
|
Noise |
en(H) en(S) |
Hold mode, sample mode 10 Hz to 10 kHz, see figure 17, TA = +25°C |
01,02 |
10 |
µVrms |
|
Settling time |
tS |
VIN = 0 V, VO ≤ 1 mV, hold mode, see figure 18, TA = +25°C |
01,02 |
1.5 |
µs |
|
1/ This parameter is specified at VCM = 0 V, -11.5 V, and +11.5 V with ±VCC = ±15 V, and at VCM = -2 V and +2 V with
±VCC = ±5 V.
2/ Input impedance is calculated from the VIO and IIB common mode voltage end-point range data.
3/ Feedthrough rejection ratio is very sensitive to stray capacitance between the signal INPUT (pin 3 ) and HOLD CAPACITOR (pin 6). For instance 0.5 pF of external coupling with a .01 µF hold capacitor would equal the specification limit of the device.
(For example: FRR = 20 log ((0.01 µF) / 0.5 pF) = 20 log (2 x 1 4) = 86 dB).
4/ Series charge resistance along with input signal slew rate and an external hold capacitor determine the dynamic sampling error of the device in its application (for example; DSE = K x RSC x SR where K is a
proportionality constant).
5/ The external hold capacitor should be either Teflon or polystyrene so that dielectric absorption is minimized.
This will insure that excessive "sag back" after capacitor "sample" mode charging does not occur. "Hold" step is sensitive to stray capacitance coupling between input logic signals and the "hold" capacitor.
6/ Hold mode leakage current is actually JFET junction leakage current which doubles (approximately) for each
10°C increase in junction temperature. Measurement at -55°C is not necessary since expected values are too small for typical test systems.
7/ Acquisition time at 125°C typically increases from 20 % to 100 % above the 25°C value.
8/ Aperture time at 125°C typically increases 110 % above the 25°C value.
9/ Transient response shall be measured at the common mode voltage limits (for example, VCM = -11.5 V and
+11.5 V). Any high frequency ringing shall be over within 1 microsecond. After its peak the major loop
response shall be without further oscillations.
7
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