MIL-M-38510-125 Microcircuits, Linear, Sample And Hold Circuits, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, sample and hold circuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4

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MIL-M-38510/1258

NOTES:

1. Aperture time is equal to the time delay from the VLOGIC 1 device under test (D.U.T.) 'hold' command step to the 10 V input transition which yields a 0.1 volt output error from its 2 µs delayed value E0(1).

2. A flow chart for the automatic determination of aperture time is shown in figure 13. All four combinations

of 10 V input and 5 V logic signals shall be checked.

3. The adapter S/H U2 holds the 'data' voltage for the measurement system.

FIGURE 12. Aperture time test circuit.