MIL-M-38510-655 Microcircuits, Digital, High Speed Cmos, Bus Transceivers With Three-State Outputs, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, high speed CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-385101655A

TABLE I. Electrical performance characteristics - Continued.

Test	Symbol	Conditions 11 TC = +125°C unless otherwise specified	Device type	VCC	Limits		Unit
Test	Symbol	Conditions 11 TC = +125°C unless otherwise specified	Device type	VCC	Min	Max	Unit
Propagation delay time, high-level-to- disabled output, enable to bus	tPHZ2	CL = 50 pF ±10% RL = 1 kO ±5% 71 81	06,07	4.5V	8	53	ns
	tPHZ2		08,09	4.5V	6	57	ns
Propagation delay time, high-level-to- disabled output, direction to bus	tPHZ3		08,09	4.5V	6	57	ns
Propagation delay time, low-level-to- disabled output	tPLZ1		01	4.5V	4	40	ns
			02	4.5V	4	42	ns
			03	4.5V	8	54	ns
			53	4.5V	6	54	ns
Propagation delay time, low-level-to- disabled output, enable to bus	tPLZ2		06,07	4.5V	8	53	ns
	tPLZ2		08,09	4.5V	6	57	ns
Propagation delay time, low-level-to- disabled output, direction to bus	tPLZ3		08,09	4.5V	6	57	ns

11 Complete terminal conditions shall be as specified in table III.

21 Guaranteed but not tested.

31 A minimum limit of 0.4 V applies only when test equipment limitations do not allow the GND pin to be open during testing.

41 IOZL = output set to high state. Three state output conditions are required.

IOZH = output set to low state. Three state output conditions are required.

51 Total supply current = ICC + ICC�.

61 Power dissipation capacitance (CPD) typically per transceiver.

71 Tested at VCC = 4.5 V at +125°C for sample testing and VCC = 4.5 V at +25°C for screening.

Guaranteed at other VCC voltages and temperatures. See table IA and exception in 4.4.1d.

81 For propagation and transition delay times at VCC = 2.0 V, increase limit by a factor of 5.

For propagation and transition delay times at VCC = 6.0 V, decrease limit by a factor of 5.