MIL-M-38510-207 Microcircuit, Digital, 256-Bit, Schottky, Bipolar, Programmable Read-Only Memory Prom, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, PROM microcircuits which employ thin film nichrome NiCr resistors, tungsten W, titanium tungsten TiW, or zapped vertical emitter ZVE as the fusible link or programming element. Two product assurance classes and a choice of case outlines and lead material and finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510/207E

TABLE II. Electrical test requirements.

MIL-PRF-38535 test requirements

Subgroups (see table III)

1/, 2/, 3/

Class S

devices

Class B

devices

Interim electrical parameters

Final electrical test parameters for unprogrammed devices

1*, 2, 3, 7*,

1*, 2, 3,

7*, 8

Final electrical test parameters for programmed devices

1*, 2, 3, 7*

8, 9, 10, 11

1*, 2, 3, 7*,

8, 9,

Group A test requirements

1, 2, 3, 7, 8,

9, 10, 11

1, 2, 3, 7, 8

9, 10, 11

Group B end-point electrical parameters when using the method 5005 QCI option

1, 2, 3, 7, 8,

9, 10, 11

N/A

Group C end-point electrical parameters

1, 2, 3, 7, 8,

9, 10, 11

1, 2, 3, 7, 8

Group D test requirements

1, 2, 3, 7, 8

1/ * indicates PDA applies to subgroups 1 and 7 (see 4.2c).

2/ Any or all subgroups may be combined when using high-speed testers.

3/ Subgroups 7 and 8 shall consist of verifying the pattern specified.

4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535.

4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:

a. End-point electrical parameters shall be as specified in table II herein.

b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn- in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and

power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL- STD-883.

c. For qualification inspection, at least 50 percent of the sample selected for testing in subgroup 1 shall be programmed (see 3.3.2). For quality conformance inspection, the programmability sample (see

4.4.1c) shall be included in the life tests.

4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End- point electrical parameters shall be as specified in table II herein.