MIL-M-38510-176 Microcircuits, Digital, Cmos, Latches, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/1768

Device type 02

RL = 200 kν ± 5% CL = 50 pF ± 5%

(includes wiring and probe capacitance)

NOTES:

1. The pulse generator has the following characteristics:

VGEN = VDD ±1.0%, tPH = 1.0 ±0.1 μs, tr = tf ≤ 20 ±2 ns and PRR = 200 kHz.

2. See table III for complete terminal conditions.

3. Identical measurements shall be performed on latch A and latch 8.

4. For tPHZ and tPZH, SW1 shall be connected to VSS.

5. For tPLZ and tPZL, SW2 shall be connected to VDD.

FIGURE 4. Switching time test circuit and waveforms - Continued.