MIL-M-38510-176 Microcircuits, Digital, Cmos, Latches, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/176B

TABLE I. Electrical performance characteristics - Continued.

Test	Symbol	Conditions -55°C = TA = +125°C Unless otherwise specified	Device type	Limits		Units
Test	Symbol	Conditions -55°C = TA = +125°C Unless otherwise specified	Device type	Min	Max	Units
Minimum RESETm pulse width	tPR	VDD = 10.0 Vdc, CL = 50 pF RL = 200 kO (see figure 4) TA = 25°C	02		140	ns
Minimum STROBEm pulse width	tPST		02		80	ns
Minimum data setup time low to high level	tSLH		02		30	ns
Minimum data hold time high to low level	tHHL		02		0	ns
Transition times, high to low level and low to high level	tTHL, tTLH	VDD = 5.0 Vdc, CL = 50 pF RL = 200 kO (see figure 4)	All	10	280	ns
Transition times, high to low level and low to high level	tTHL, tTLH	VDD = 10.0 Vdc, CL = 50 pF RL = 200 kO (see figure 4) TA = 25°C	All	5	100	ns