MIL-M-38510-176 Microcircuits, Digital, Cmos, Latches, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/1768

Device type 02

NOTES:

1.     The pulse generator number 1 has the following characteristics:

VGEN  = VDD  ±1.0%, tPH  = 1.0 ±0.1 μs, tr  = tf  ≤ 20 ±2 ns and PRR = 200 kHz.

2.     The pulse generator number 2 has the following characteristics:

VGEN  = VDD  ±1.0%, tPH  = 1.0 ±0.1 μs, tr  = tf  ≤ 20 ±2 ns and PRR = 100 kHz.

3.     See table III for complete terminal conditions.

4.     Identical measurements shall be performed on latch A and latch 8.

5.     Requirements for tPR, tPST, tSLH, and tHHL are established by setting the parameter to the limit given in table III

and observing proper output state change.

FIGURE 4.  Switching time test circuit and waveforms - Continued.

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