TABLE III. Group A inspection for device types 01 and 06 - Continued. Terminal conditions (pins not designated may be high � 2.4 V, low s 0.4 V, or open)
Subgroup |
Symbol |
MIL- STD-883 method |
Cases A,B,C,D |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Measured terminal |
Limits |
Unit |
|
Test no. |
Q |
NC |
A1 |
A2 |
B |
Q |
GND |
NC |
R1 |
CX |
RXCX |
NC |
NC |
VCC |
Min |
Max |
|||||
9 Tc = +25°C |
tPLH1 tPHL1 tPLH2 tPHL2 |
3003 (Fig. 4) " " |
38 39 40 41 |
OUT OUT |
GND GND 5.0 V 5.0 V |
IN IN |
IN IN 5.0 V 5.0 V |
OUT OUT |
GND " " " |
3/ " " " |
9/ " " " |
9/ " " " |
5.0 V " " " |
B to Q B to Q A2 to Q A2 to Q |
15 20 25 30 |
59 69 74 84 |
ns " " " |
||||
tP(OUT)1 tP(OUT)2 tP(OUT)3 tP(OUT)4 |
3003 (Fig. 5) " " |
42 43 44 45 |
GND " " " |
GND " " " |
IN " " " |
OUT " " " |
" " " " |
" " |
" 10/ 11/ 12/ |
" 10/ 11/ 13/ 12/ 13/ |
" " " " |
Q Q Q Q |
70 20 600 5.5 |
150 50 825 8 |
" " " µs |
||||||
10 Tc = +125°C |
tPLH1 tPHL1 tPLH2 tPHL2 |
3003 (Fig. 4) " " |
46 47 48 49 |
OUT OUT |
" " 5.0 V 5.0 V |
IN IN |
" " 5.0 V 5.0 V |
" OUT |
" " " " |
3/ " " " |
9/ " " " |
9/ " " " |
" " " " |
B to Q B to Q A2 to Q A2 to Q |
15 20 25 30 |
75 87 93 106 |
ns " " " |
||||
tP(OUT)1 tP(OUT)2 tP(OUT)3 tP(OUT)4 |
3003 (Fig. 5) " " |
50 51 52 53 |
GND " " " |
GND " " " |
IN " " " |
OUT " " " |
" " " " |
" " |
" 10/ 11/ 12/ |
" 10/ 11/ 13/ 12/ 13/ |
" " " " |
Q Q Q Q |
70 20 600 5.5 |
150 15/ 50 825 8 |
" " " µs |
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11 |
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C. |
1/ For circuit D, test numbers 2 and 4, terminal A2 shall be 0.8 V shall be 2.0 V.
2/ In transition from low level to high level.
3/ R1 connected to VCC.
4/ RXCX and CX are open.
5/ In transition from high level to low level.
6/ Output voltages fro subgroups 7 and 8: H � 1.5 V, L s 1.5 V.
7/ One low logic level pulse.
8/ One high logic level pulse.
9/ CX connected to RXCX through an 80 pF capacitor.
10/ CX connected to RXCX through an 25 pF capacitor which includes stray, probe, and jig capacitor.
11/ CX connected to RXCX through an 100 pF capacitor.
12/ CX connected to RXCX through an 1,000 pF capacitor.
13/ RXCX connected to VCC through a 10 kn resistor.
14/ A = 2.0 V and B = 0.8 V for subgroup 7. A = 2.4 V and B = 0.4 V for subgroup 8.
15/ For device type 06 only, tP(OUT)1 maximum test limit under TABLE I and TABLE III is 168 ns at -55°C and +125°C.
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