MIL-M-38510-12 Microcircuits, Digital, Bipolar, Ttl, Monostable Multivibrators, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, bipolar, TTL, monostable multivibrators microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/12J

TABLE I. Electrical performance characteristics - continued.

Test	Symbol	Conditions -55qC ≤ TC ≤ +125qC unless otherwise specified	Device type	Limits		Units
				Min	Max
Minimum pulse width of Q output pulse	tW(MIN)	VCC = 5.0 V, CL = 50 pF ±10%, CX = 0, RX = 10 kn ±5%, RL = 390 n ±5%, figure 9 (device type 05)	05	35	108	ns
		VCC = 5.0 V, 5/ CL = 50 pF ±10%, CX = 15 pF max, RX = 10 kn ±5%, RL = 390 n ±5%, figure 9 (device type 05)	05	35	140
Width of Q output pulse	tW	VCC = 5.0 V, CL = 50 pF ±10%, CX = 1,000 pF ±10%, RL = 390 n ±5%, RX = 10 kn ±5%, figure 9 (device type 05)	05	2.60	3.91	s

1/ Ground CX to measure VOH at Q, VOL at Q ,or IOS at Q. CX is open to measure VOH at Q, VOL at Q, or IOS at Q . (Device types 02 and 03).

2/ Not more than one output should be shorted at a time.

3/ For device types 02 and 03: ICC is measured (after clearing) with 2.4 V applied to all clear and A inputs, B inputs grounded, all outputs open, CX = 0.02 µF and RX = 25 kn. RI of device type 02 is open.

4/ For device types 02 and 03: ICC is measured in the triggered state with 2.4 V applied to all clear and B inputs, A inputs grounded, all outputs open, CX = 0.02 µF and RX = 25 kn. RI of device type 02 is open.

5/ 15 pF load is for automatic test equipment only, which includes probe and jig capacitance.

3.6 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III.

3.8 Marking. Marking shall be in accordance with MIL-PRF-38535.

3.9 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 3 (see MIL-PRF-38535, appendix A).