MIL-M-38510-101 Microcircuits, Linear, Operational Amplifier, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, operational amplifiers. Two product assurance classes and a choice of case outlines and lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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1/   For  devices marked with the "Q" certification mark, the parameters listed herein may be guaranteed if not tested to the limits specified herein in accordance with the  manufacturer's

QM plan.  Limits apply to both halves of dual devices (02, 05, 06, and 08) independently, and slew rate limit for device 08 is 0.4 V/µs at all temperatures (tests 109, 110, 116, 117,

120, 121).

2/   VCM is achieved by algebraically subtracting the common mode voltage from each supply and algebraically adding the common mode voltage to V (example, for VCM = -15 V, +VCC = +35 V, -VCC = -5 V, V = -15 V).

3/   VIO (ADJ) is not performed on device type 02, case I only, or on device types 04, 06, and 08 all case types.

4/   Due to the significant power dissipation and associated device heating, these tests shall always be the last tests performed in any given sequence, followed by operational verification (example, such tests as VOPP, AVS, TR, SR).

5/   Limit shown applied to single devices (01, 03, and 04) only.  The maximum quiescent ICC for dual devices (02, 05, 06, and 08) is twice that shown for single devices.

6/   Tests 29, 34, 55, and 60 which require a read and record measurement plus a calculation, may be omitted except when subgroups 2 and 3 are being accomplished for group A

sampling inspection and group C and D endpoint measurements.

7/   Applies to device types 02, 05, and 06 only.