MIL-M-38510-101 Microcircuits, Linear, Operational Amplifier, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, operational amplifiers. Two product assurance classes and a choice of case outlines and lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510/101K

TABLE I. Electrical performance characteristics - Continued. 1/

Test	Symbol	Conditions -55°C ≤ TA ≤ +125°C see figure 3 unless otherwise specified	Group A subgroups	Device type	Limits		Unit
					Min	Max
Noise (referred to input) broadband	NI(BB)	±VCC = 20 V, TA = +25°C, bandwidth = 5 kHz	7	01-06, 08		15	µVrms
				07		25
Noise (referred to input) popcorn	NI(PC)	±VCC = 20 V, TA = +25°C, bandwidth = 5 kHz	7	01,02, 04,06, 08		40	µVpk
				03,05, 07		80

1/ For devices marked with the "Q" certification mark, the parameters listed herein maybe guaranteed if not tested to the limits specified herein in accordance with the manufacturer's QM plan.

2/ Tests at common mode VCM = 0 V, VCM = -15 V, and VCM = +15 V.

3/ VIO(ADJ) is not performed on device type 02, case I only, or on device type 08 for either case G or P.

4/ Continuous short circuit limits will be considerably less than the indicated test limits. Continuous IOS at TA ≤ +75°C

will cause TJ to exceed the maximum of +175°C. For dual devices, IOS is measured one channel at a time.

5/ Value shown is for single devices (01, 03, 04) only. For dual devices (02, 05, 06, and 08) this limit is for single devices.

6/ Note that gain is not specified at VIO(ADJ) extremes. Some gain reduction is usually seen at VIO(ADJ) extremes.

For closed loop applications (closed loop gain less than 1,000), the open loop tests (AVS) prescribed herein should

guarantee a positive, reasonably linear, transfer characteristic. They do not, however, guarantee that the open loop gain is linear, or even positive, over the operating range. If either of these requirements exist (positive open

loop gain or open loop gain linearity), they should be specified in the individual procurement document as

additional requirements.

7/ RL = 10 kn only for device types 04 and 06.

8/ For transient response tests, CF = 10 pF for device types 01, 02, 03, 04, 05, 06, and 08. Device type 07, CF = 47 pF. CF includes the effects of stray capacitance.

9/ Minimum limit for device 08 is 0.4 V/µs at all temperatures.

10/ Minimum limits for device types 03 and 05 are 0.2 V/µs at -55°C and 0.3 V/µs at both +25°C and +125°C.

11/ Settling time is waived for method 5004, MIL-STD-883 except for device type 07.