MIL-M-38510-763 Microcircuits, Digital, Advanced Cmos, Counters, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/763B

6.4  Qualification.  With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have actually

been so listed by that date.  The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that they may be

eligible to be awarded contracts or purchase orders for the products covered by this specification.  Information pertaining to

qualification of products may be obtained from DSCC-VQ, P.O. Box 3990, Columbus, Ohio 43218-3990.

6.5  Abbreviations, symbols, and definitions.  The abbreviations, symbols, and definitions used herein are defined in

MIL-PRF-38535, MIL-HDBK-1331, and as follows:

GND  ............................................ Ground zero voltage potential

O/V............................................... Latch-up over-voltage O/I ................................................ Latch-up over-current ICC................................................. Quiescent supply current IIL .................................................. Input current low

IIH.................................................. Input current high

TC  ................................................ Case temperature

TA ................................................. Ambient temperature

VCC ............................................... Positive supply voltage

CIN ................................................ Input terminal-to-GND capacitance

CPD ............................................... Power dissipation capacitance

VIC ................................................ Input clamp voltage

VGB ............................................... Ground bounce voltage

tw .................................................. Trigger duration (width)

6.6  Logistic support.  Lead materials and finishes (see 3.4) are interchangeable.  Unless otherwise specified, microcircuits acquired for Government logistic support will be acquired to device class S for National Aeronautics and Space Administration or class B for Department of Defense (see 1.2.2), lead material and finish A (see 3.4).  Longer length leads and lead forming should not affect the part number.

6.7  Data reporting.  When specified in the purchase order or contract, a copy of the following data, as applicable, will be supplied. a.  Attributes data for all screening tests (see 4.2) and variables data for all static burn-in, dynamic burn-in, RHA tests, and

steady-state life tests (see 3.6). b.  A copy of each radiograph.

c.   The technology conformance inspection (TCI) data (see 4.4).

d.  Parameter distribution data on parameters evaluated during burn-in (see 3.6). e.  Final electrical parameters data (see 4.2e).

f.   RHA delta limits.

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