MIL-M-38510-763 Microcircuits, Digital, Advanced Cmos, Counters, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/763B

TABLE II. Burn-in and electrical test requirements.

Line no.	MIL-PRF-38535 test requirements	Class S device 1/			Class B device 1/
Line no.	MIL-PRF-38535 test requirements	Reference paragraph	Table I subgroups 2/	Table III delta limits 3/	Reference paragraph	Table I subgroups 2/	Table III delta limits 3/
1	Interim electrical parameters		1			1
2	Static burn-in I (method 1015)	4.2c 4.5.2	Req'd 5/			Not req'd
3	Same as line 1		1	�
4	Static burn-in II (method 1015)	4.2c 4.5.2	Req'd 5/		4.2c 4.5.2	Req'd 4/
5	Same as line 1	4.2e	1*	�	4.2e	1*	�
6	Dynamic burn-in (method 1015)	4.2d 4.5.2	Req'd 5/			Not req'd
7	Same as line 1	4.2e	1	�
8	Final electrical parameters		1, 2, 7, 9			1*, 2, 7, 9 4/
9	Group A test requirements (method 5005)	4.4.1	1, 2, 3, 4, 7, 8, 9, 10, 11		4.4.1	1, 2, 3, 4, 7, 8, 9, 10, 11
10	Group B test when using the method 5005 QCI option	4.4.2	1, 2, 3, 7, 8, 9, 10, 11	�
11	Group C end- point electrical parameters (method 5005)				4.4.3	1, 2	�
12	Group D end- point electrical parameters (method 5005)	4.4.4	1, 2, 3		4.4.4	1, 2
13	Group E end- point electrical parameters (method 5005)	4.4.5	1, 7, 9		4.4.5	1, 7, 9

1/ Blank spaces indicate tests are not applicable.

2/ * indicates PDA applies to subgroups 1 and/or 7, as applicable (see 4.2.1).

3/ � indicates delta limits and shall be required only on table I, subgroup 1, where specified, and the delta values shall be computed with reference to the previous interim electrical parameters (line 1).

4/ The device manufacturer may, at his option, either complete subgroup 1 electrical parameter measurements, including delta measurements, within 96 hours after burn-in completion (removal of bias) or may complete subgroup 1 electrical measurements without delta measurements within 24 hours after burn-in completion (removal of bias). When the manufacturer elects to perform the subgroup 1 electrical parameter measurements without delta measurements, there is no requirement to perform the pre-burn- in tests (first interim electrical parameters test in table II).

5/ On all class S lots, the device manufacturer shall maintain read-and-record data (as a minimum on disk) for burn-in electrical parameters (group A, subgroup 1), in accordance with method 5004 of MIL-STD-883. For preburn-in and interim electrical parameters, the read-and-record requirements are for delta measurements only.