MIL-M-38510-658 Microcircuits, Digital, High Speed, Cmos, Decoders, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, CMOS logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/658A

TABLE I. Electrical performance characteristics - Continued.

Test	8ymbol		Conditions 1/ TC = +125°C unless otherwise specified	Device type	VCC	Limits		Unit
						Min	Max
8hort-circuit output current	I081 2/		TC = -55°C to +125°C V0 = GND VI = GND	01,02 03,04	2.0V	-2	-50	mA
	I082 2/				4.5V	-15	-150
	I083 2/				6.0V	-25	-180
	I084				4.0V	-10	-120
	I082 2/			52,53	4.5V	-15	-150
	I085 2/				5.5V	-25	-180
	I084				4.0V	-10	-120
8upply current quiescent	ICC		VI = GND or VCC	All	6.0V		20	µA
Additional supply current quiescent per input pin (one unit load)	ICC� 3/		VIL = 0.8 V VIH = 2.4 V Test pin at VIN = 2.4 V 0ther pins at 0.8 V or 5.5 V I0 = 0 V	52	5.5V		3.0	mA
				53			1.5
Input capacitance	CI		TC = +25°C	All			10	pF
Power dissipation capacitance	CPD 2/ 4/		TC = +25°C	01			65	pF
				02			85
				03			75
				04			90
				52			85
				53			75
Propagation delay times, input to output 5/ 6/	tPHL1, tPLH1		CL = 50 pF ± 10%	01	4.5V	4	35	ns
	tPLH1			02	4.5V	4	47
	tPHL1					5
	tPLH1, tPHL1	4 levels		03	4.5V	6	51
	tPLH1, tPHL1	5 levels				8
	tPLH1, tPHL1			04	4.5V	6	44
	tPLH1			52	4.5V	5	47
	tPHL1					6
	tPLH1, tPHL1	4 levels		53	4.5V	5	41
	tPLH1, tPHL1	5 levels				7	41
Propagation delay times, enable to output 5/ 6/	tPHL2, tPLH2		CL = 50 pF ± 10%	02	4.5V	4	41	ns
				03	4.5V	6	41
				04	4.5V	6	42
				52	4.5V	4	47
				53	4.5V	5	47
Transition delay times 5/ 6/	tTHL, tTLH			All	4.5V	3	20

1/ Complete terminal conditions and limits shall be as specified in table III.

2/ Guaranteed but not tested.

3/ Total supply current = ICC + ICC�.

4/ Power dissipation capacitance (CPD) per decoder/demultiplexer.

5/ Tested at VCC = 4.5 V at +125°C for sample testing and VCC = 4.5 V at +25°C for screening.

Guaranteed at other VCC voltages and temperatures, see table IA and exception in 4.4.1d.